Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications
<p>The EDELWEISS-III experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at low fields (< 1 V=cm), and as a consequence charge-carrier trapping significantly affects both the ionization and heat energy measurements. This paper...
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Formatua: | Journal article |
Argitaratua: |
Institute of Physics
2016
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