Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

<p>The EDELWEISS-III experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at low fields (&lt; 1 V=cm), and as a consequence charge-carrier trapping significantly affects both the ionization and heat energy measurements. This paper...

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Bibliographic Details
Main Authors: Arnaud, Q, Armengaud, E, Augier, C, Benoît, A, Bergé, L, Billard, J, Blümer, J, de Boissière, T, Broniatowski, A, Camus, P, Cazes, A, Chapellier, M, Charlieux, F, Dumoulin, L, Eitel, K, Foerster, N, Fourches, N, Gascon, J, Giuliani, A, Gros, M, Hehn, L, Heuermann, G, de Jésus, M, Lin, J, Juillard, A, Kleifges, M, Kozlov, V, Kraus, H, Kéfélian, C, Kudryavtsev, V, Le-Sueur, H, Marnieros, S, Navick, X, Nones, C, Olivieri, E, Pari, P, Paul, B, Piro, M, Poda, D, Queguiner, E, Rozov, S, Sanglard, V, Schmidt, B, Scorza, S, Siebenborn, B, Tcherniakhovski, D, Vagneron, L, Weber, M, Yakushev, E
Format: Journal article
Published: Institute of Physics 2016

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