$High-resolution electron backscatter diffraction in III-nitride semiconductors$

High-resolution electron backscatter diffraction in III-nitride semiconductors

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A
Μορφή:	Conference item
Έκδοση:	Cambridge University Press 2015

Παρόμοια τεκμήρια

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
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Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
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Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
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Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
ανά: Trager-Cowan, C, κ.ά.
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Analysis of dislocation densities using high resolution electron backscatter diffraction
ανά: Vilalta-Clemente, A, κ.ά.
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Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
ανά: Naresh-Kumar, G, κ.ά.
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Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2002)

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy
ανά: Naresh-Kumar, G, κ.ά.
Έκδοση: (2022)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2018)

Characterisation of epitaxial lateral overgrown GaN by electron backscatter diffraction correlated with cross-sectional cathodoluminescence spectroscopy
ανά: Sweeney, F, κ.ά.
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High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
ανά: Wilkinson, A, κ.ά.
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High resolution mapping of strains and rotations using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
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High resolution mapping of strains and rotations using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
ανά: Tong, V, κ.ά.
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Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
ανά: Britton, T, κ.ά.
Έκδοση: (2011)

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
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Electron backscatter diffraction study for advanced semiconductor interconnect materials analysis
ανά: Lee, Aaron Wai Ken
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Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
ανά: Britton, T, κ.ά.
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High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
ανά: Wilkinson, A
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High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
ανά: Wilkinson, A
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Strain mapping using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2009)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
ανά: Britton, T, κ.ά.
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An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
ανά: Koko, A, κ.ά.
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Direct detection of electron backscatter diffraction patterns.
ανά: Wilkinson, A, κ.ά.
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High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
ανά: Wilkinson, A, κ.ά.
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Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
ανά: Wallis, D, κ.ά.
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Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
ανά: Trager-Cowan, C, κ.ά.
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Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
ανά: Britton, T, κ.ά.
Έκδοση: (2010)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
ανά: Koko, A, κ.ά.
Έκδοση: (2022)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
ανά: Dingley, D, κ.ά.
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High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
ανά: Wallis, D, κ.ά.
Έκδοση: (2019)

High resolution electron backscatter diffraction study on the heterogeneities of tetragonal distortion in Fe-C martensite at the microstructural scale
ανά: Tanaka, T, κ.ά.
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Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
ανά: Kamaya, M, κ.ά.
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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
ανά: Tong, V, κ.ά.
Έκδοση: (2015)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
ανά: Jiang, J, κ.ά.
Έκδοση: (2013)

A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper
ανά: Jiang, J
Έκδοση: (2013)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
ανά: Wilkinson, A
Έκδοση: (1997)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
ανά: Kamaya, M, κ.ά.
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Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
ανά: Nowakowski Pawel, κ.ά.
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Tetragonality of Fe-C martensite – a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction
ανά: Tanaka, T, κ.ά.
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