$High-resolution electron backscatter diffraction in III-nitride semiconductors$

High-resolution electron backscatter diffraction in III-nitride semiconductors

書誌詳細
主要な著者:	Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A
フォーマット:	Conference item
出版事項:	Cambridge University Press 2015

類似資料

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
著者:: Wilkinson, A, 等
出版事項: (2016)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
著者:: Trager-Cowan, C, 等
出版事項: (2006)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
著者:: Trager-Cowan, C, 等
出版事項: (2007)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
著者:: Trager-Cowan, C, 等
出版事項: (2006)

Analysis of dislocation densities using high resolution electron backscatter diffraction
著者:: Vilalta-Clemente, A, 等
出版事項: (2015)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
著者:: Naresh-Kumar, G, 等
出版事項: (2017)

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
著者:: Trager-Cowan, C, 等
出版事項: (2002)

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy
著者:: Naresh-Kumar, G, 等
出版事項: (2022)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
著者:: Wilkinson, A, 等
出版事項: (2018)

Characterisation of epitaxial lateral overgrown GaN by electron backscatter diffraction correlated with cross-sectional cathodoluminescence spectroscopy
著者:: Sweeney, F, 等
出版事項: (2006)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
著者:: Wilkinson, A, 等
出版事項: (2010)

High resolution mapping of strains and rotations using electron backscatter diffraction
著者:: Wilkinson, A, 等
出版事項: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
著者:: Wilkinson, A, 等
出版事項: (2006)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
著者:: Tong, V, 等
出版事項: (2015)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
著者:: Britton, T, 等
出版事項: (2011)

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
著者:: Winkelmann, A, 等
出版事項: (2017)

Electron backscatter diffraction study for advanced semiconductor interconnect materials analysis
著者:: Lee, Aaron Wai Ken
出版事項: (2022)

Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
著者:: Britton, T, 等
出版事項: (2013)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
著者:: Wilkinson, A
出版事項: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
著者:: Wilkinson, A
出版事項: (2006)

Strain mapping using electron backscatter diffraction
著者:: Wilkinson, A, 等
出版事項: (2009)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
著者:: Britton, T, 等
出版事項: (2012)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
著者:: Koko, A, 等
出版事項: (2023)

Direct detection of electron backscatter diffraction patterns.
著者:: Wilkinson, A, 等
出版事項: (2013)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
著者:: Wilkinson, A, 等
出版事項: (2006)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
著者:: Wallis, D, 等
出版事項: (2016)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
著者:: Trager-Cowan, C, 等
出版事項: (2008)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
著者:: Britton, T, 等
出版事項: (2010)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
著者:: Koko, A, 等
出版事項: (2022)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
著者:: Dingley, D, 等
出版事項: (2010)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
著者:: Wallis, D, 等
出版事項: (2019)

High resolution electron backscatter diffraction study on the heterogeneities of tetragonal distortion in Fe-C martensite at the microstructural scale
著者:: Tanaka, T, 等
出版事項: (2020)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
著者:: Kamaya, M, 等
出版事項: (2005)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
著者:: Tong, V, 等
出版事項: (2015)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
著者:: Jiang, J, 等
出版事項: (2013)

A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper
著者:: Jiang, J
出版事項: (2013)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
著者:: Wilkinson, A
出版事項: (1997)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
著者:: Kamaya, M, 等
出版事項: (2006)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
著者:: Nowakowski Pawel, 等
出版事項: (2024-01-01)

Tetragonality of Fe-C martensite – a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction
著者:: Tanaka, T, 等
出版事項: (2020)