$High-resolution electron backscatter diffraction in III-nitride semiconductors$

High-resolution electron backscatter diffraction in III-nitride semiconductors

Библиографические подробности
Главные авторы:	Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A
Формат:	Conference item
Опубликовано:	Cambridge University Press 2015

Схожие документы

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
по: Wilkinson, A, и др.
Опубликовано: (2016)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
по: Trager-Cowan, C, и др.
Опубликовано: (2006)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
по: Trager-Cowan, C, и др.
Опубликовано: (2007)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
по: Trager-Cowan, C, и др.
Опубликовано: (2006)

Analysis of dislocation densities using high resolution electron backscatter diffraction
по: Vilalta-Clemente, A, и др.
Опубликовано: (2015)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
по: Naresh-Kumar, G, и др.
Опубликовано: (2017)

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
по: Trager-Cowan, C, и др.
Опубликовано: (2002)

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy
по: Naresh-Kumar, G, и др.
Опубликовано: (2022)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
по: Wilkinson, A, и др.
Опубликовано: (2018)

Characterisation of epitaxial lateral overgrown GaN by electron backscatter diffraction correlated with cross-sectional cathodoluminescence spectroscopy
по: Sweeney, F, и др.
Опубликовано: (2006)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
по: Wilkinson, A, и др.
Опубликовано: (2010)

High resolution mapping of strains and rotations using electron backscatter diffraction
по: Wilkinson, A, и др.
Опубликовано: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
по: Wilkinson, A, и др.
Опубликовано: (2006)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
по: Tong, V, и др.
Опубликовано: (2015)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
по: Britton, T, и др.
Опубликовано: (2011)

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
по: Winkelmann, A, и др.
Опубликовано: (2017)

Electron backscatter diffraction study for advanced semiconductor interconnect materials analysis
по: Lee, Aaron Wai Ken
Опубликовано: (2022)

Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
по: Britton, T, и др.
Опубликовано: (2013)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
по: Wilkinson, A
Опубликовано: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
по: Wilkinson, A
Опубликовано: (2006)

Strain mapping using electron backscatter diffraction
по: Wilkinson, A, и др.
Опубликовано: (2009)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
по: Britton, T, и др.
Опубликовано: (2012)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
по: Koko, A, и др.
Опубликовано: (2023)

Direct detection of electron backscatter diffraction patterns.
по: Wilkinson, A, и др.
Опубликовано: (2013)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
по: Wilkinson, A, и др.
Опубликовано: (2006)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
по: Wallis, D, и др.
Опубликовано: (2016)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
по: Trager-Cowan, C, и др.
Опубликовано: (2008)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
по: Britton, T, и др.
Опубликовано: (2010)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
по: Koko, A, и др.
Опубликовано: (2022)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
по: Dingley, D, и др.
Опубликовано: (2010)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
по: Wallis, D, и др.
Опубликовано: (2019)

High resolution electron backscatter diffraction study on the heterogeneities of tetragonal distortion in Fe-C martensite at the microstructural scale
по: Tanaka, T, и др.
Опубликовано: (2020)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
по: Kamaya, M, и др.
Опубликовано: (2005)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
по: Tong, V, и др.
Опубликовано: (2015)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
по: Jiang, J, и др.
Опубликовано: (2013)

A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper
по: Jiang, J
Опубликовано: (2013)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
по: Wilkinson, A
Опубликовано: (1997)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
по: Kamaya, M, и др.
Опубликовано: (2006)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
по: Nowakowski Pawel, и др.
Опубликовано: (2024-01-01)

Tetragonality of Fe-C martensite – a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction
по: Tanaka, T, и др.
Опубликовано: (2020)