$High-resolution electron backscatter diffraction in III-nitride semiconductors$

High-resolution electron backscatter diffraction in III-nitride semiconductors

Bibliográfalaš dieđut
Váldodahkkit:	Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A
Materiálatiipa:	Conference item
Almmustuhtton:	Cambridge University Press 2015

Geahča maid

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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
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