Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111)
Surface structure and electronic properties of In20 3(111) single-crystal thin films grown on V-stabilized Zr0 2(1 11) was observed. The surface geometrical structure was examined by atomic force microscopy (AFM), scanning tunneling microscope (STM) and low electron energy diffraction (LEED). The su...
| Main Authors: | , , , , , , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2009
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