Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination.
Using a conventional transmission electron microscope that incorporates a field emission gun it is possible to focus an electron beam to form a small probe (<1nm full-width at half-maximum). Such a probe can then be used to perform high spatial resolution diffraction experiments. The high spa...
Үндсэн зохиолчид: | McBride, W, Cockayne, D, Nguyen-Manh, D |
---|---|
Формат: | Journal article |
Хэл сонгох: | English |
Хэвлэсэн: |
2003
|
Ижил төстэй зүйлс
Ижил төстэй зүйлс
-
The structure of nanovolumes of amorphous materials
-н: McBride, W, зэрэг
Хэвлэсэн: (2003) -
Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
-н: McBride, W, зэрэг
Хэвлэсэн: (2003) -
Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling.
-н: Cockayne, D, зэрэг
Хэвлэсэн: (2000) -
Reduced density function analysis using convergent electron illumination and iterative blind deconvolution
-н: McBride, W, зэрэг
Хэвлэсэн: (1999) -
Electron diffraction studies of the structure of amorphous and polycrystalline materials
-н: Cockayne, D, зэрэг
Хэвлэсэн: (1998)