Rapid, substrate-independent thickness determination of large area graphene layers
Phase-shifting interferometric imaging is shown to be a powerful analytical tool for studying graphene films, providing quantitative analysis of large area samples with an optical thickness resolution of ≥ 0.05 nm. The technique is readily able to identify single sheets of graphene and to quantitati...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2011
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