Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction
The deformation around a 500-nm deep Berkovich indent in a large grained Fe sample has been studied using high resolution electron back scatter diffraction (EBSD). EBSD patterns were obtained in a two-dimensional map around the indent on the free surface. A cross-correlation-based analysis of small...
| Päätekijät: | , |
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| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
2010
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