STATISTICAL-ANALYSIS OF ATOM PROBE DATA

STATISTICAL-ANALYSIS OF ATOM PROBE DATA

Dettagli Bibliografici
Autori principali:	Hetherington, M, Cerezo, A, Hyde, J, Smith, G, Worrall, G
Natura:	Journal article
Lingua:	English
Pubblicazione:	1986

Documenti analoghi

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
di: Hetherington, M, et al.
Pubblicazione: (1992)

VISUALIZATION AND ANALYSIS OF 3-DIMENSIONAL ATOM PROBE DATA
di: Cerezo, A, et al.
Pubblicazione: (1989)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1989)

ANALYSIS OF DATA FROM AN OPTICAL ATOM-PROBE
di: Cooper, A, et al.
Pubblicazione: (1994)

Statistical analysis of atom probe data: detecting the early stages of solute clustering and/or co-segregation.
di: Hyde, J, et al.
Pubblicazione: (2009)

NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
di: Cerezo, A, et al.
Pubblicazione: (1992)

QUANTITATIVE ATOM PROBE ANALYSIS OF SPINODAL REACTION IN FERRITE PHASE OF DUPLEX STAINLESS-STEEL
di: Brown, J, et al.
Pubblicazione: (1990)

IMPROVEMENTS IN 3-DIMENSIONAL ATOM-PROBE DESIGN
di: Cerezo, A, et al.
Pubblicazione: (1994)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
di: Cerezo, A, et al.
Pubblicazione: (1990)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
di: Cerezo, A, et al.
Pubblicazione: (1994)

ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
di: Petfordlong, A, et al.
Pubblicazione: (1992)

ATOM PROBE CHARACTERIZATION OF CO TRANSITION-METAL MULTILAYER STRUCTURES
di: Cerezo, A, et al.
Pubblicazione: (1989)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
di: Smith, G, et al.
Pubblicazione: (1994)

LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
di: Hyde, J, et al.
Pubblicazione: (1994)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
di: Cerezo, A, et al.
Pubblicazione: (2001)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
di: Grovenor, C, et al.
Pubblicazione: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
di: Grovenor, C, et al.
Pubblicazione: (1990)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
di: Grovenor, C, et al.
Pubblicazione: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
di: Cerezo, A, et al.
Pubblicazione: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
di: Cerezo, A, et al.
Pubblicazione: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
di: Grovenor, C, et al.
Pubblicazione: (1987)

Detecting clusters in atom probe data with Gaussian mixture models.
di: Zelenty, J, et al.
Pubblicazione: (2017)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1989)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
di: Cerezo, A, et al.
Pubblicazione: (1991)

POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
di: Setna, R, et al.
Pubblicazione: (1993)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
di: Cerezo, A, et al.
Pubblicazione: (1988)

A UK Facility for Atom Probe Tomography Analysis
di: Marquis, E, et al.
Pubblicazione: (2009)

AN FIM-ATOM PROBE AND TEM STUDY OF ALNICO PERMANENT MAGNETIC MATERIAL
di: Cowley, S, et al.
Pubblicazione: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
di: Cerezo, A, et al.
Pubblicazione: (1986)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
di: Sijbrandij, S, et al.
Pubblicazione: (1995)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
di: Smith, G, et al.
Pubblicazione: (1998)

AN ELECTRONIC AND COMPUTER-SYSTEM FOR AN AUTOMATED ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1984)

SPINODAL DECOMPOSITION IN FE-CR ALLOYS - EXPERIMENTAL-STUDY AT THE ATOMIC-LEVEL AND COMPARISON WITH COMPUTER-MODELS .1. INTRODUCTION AND METHODOLOGY
di: Miller, M, et al.
Pubblicazione: (1995)

SPINODAL DECOMPOSITION IN FE-CR ALLOYS - EXPERIMENTAL-STUDY AT THE ATOMIC-LEVEL AND COMPARISON WITH COMPUTER-MODELS .3. DEVELOPMENT OF MORPHOLOGY
di: Hyde, J, et al.
Pubblicazione: (1995)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
di: Grovenor, C, et al.
Pubblicazione: (1985)

Improvements in the mass resolution of the three-dimensional atom probe
di: Sijbrandij, S, et al.
Pubblicazione: (1996)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
di: Cerezo, A, et al.
Pubblicazione: (1988)

SPINODAL DECOMPOSITION IN FE-CR ALLOYS - EXPERIMENTAL-STUDY AT THE ATOMIC-LEVEL AND COMPARISON WITH COMPUTER-MODELS .2. DEVELOPMENT OF DOMAIN SIZE AND COMPOSITION AMPLITUDE
di: Hyde, J, et al.
Pubblicazione: (1995)

THE FIM100 - PERFORMANCE OF A COMMERCIAL ATOM PROBE SYSTEM
di: Cerezo, A, et al.
Pubblicazione: (1984)