Observation of K-Shell Soft X Ray Emission of Nitrogen Irradiated by XUV-Free Electron Laser FLASH at Intensities Greater than 10(16) W/cm(2)

In the past few years, the development of light sources of the 4th generation, namely XUV/X-ray Free Electron Lasers provides to the scientific community outstanding tools to investigate matter under extreme conditions never obtained in laboratories so far. As theory is at its infancy, the analysis...

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Những tác giả chính: Galtier, E, Rosmej, F, Renner, O, Juha, L, Chalupsky, J, Gauthier, J, White, S, Riley, D, Vinko, S, Witcher, T, Wark, J, Nagler, B, Lee, R, Nelson, A, Toleikis, S
Định dạng: Journal article
Ngôn ngữ:English
Được phát hành: 2011