Direct electron detection for TEM with column parallel CCD

Direct electron detection for TEM with column parallel CCD

Step improvements in electron detectors are needed for transmission electron microscopes (TEM) to take full advantage of latest developments in electron optics and electron sources. This work presents beam tests performed with column parallel charge-coupled devices (CPCCD) and discusses measured clu...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Moldovan, G, Jeffery, B, Nomerotski, A, Kirkland, A
Μορφή:	Conference item
Έκδοση:	2009

Παρόμοια τεκμήρια

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