Direct electron detection for TEM with column parallel CCD
Step improvements in electron detectors are needed for transmission electron microscopes (TEM) to take full advantage of latest developments in electron optics and electron sources. This work presents beam tests performed with column parallel charge-coupled devices (CPCCD) and discusses measured clu...
| 主要な著者: | , , , |
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| フォーマット: | Conference item |
| 出版事項: |
2009
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