Microstructural characterisation of novel nitride nanostructures using electron microscopy
<p>Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth...
| Հիմնական հեղինակ: | |
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| Այլ հեղինակներ: | |
| Ձևաչափ: | Թեզիս |
| Լեզու: | English |
| Հրապարակվել է: |
2014
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| Խորագրեր: |