Microstructural characterisation of novel nitride nanostructures using electron microscopy

Microstructural characterisation of novel nitride nanostructures using electron microscopy

<p>Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth...

書誌詳細
第一著者:	Severs, J
その他の著者:	Nellist, P
フォーマット:	学位論文
言語:	English
出版事項:	2014
主題:	Nanostructures Atomic scale structure and properties Advanced materials Microscopy Materials Sciences Optoelectronics Microscopy and microanalysis High resolution microscopy Electron image analysis Semiconductors

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