Microstructural characterisation of novel nitride nanostructures using electron microscopy

Microstructural characterisation of novel nitride nanostructures using electron microscopy

<p>Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth...

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Chi tiết về thư mục
Tác giả chính:	Severs, J
Tác giả khác:	Nellist, P
Định dạng:	Luận văn
Ngôn ngữ:	English
Được phát hành:	2014
Những chủ đề:	Nanostructures Atomic scale structure and properties Advanced materials Microscopy Materials Sciences Optoelectronics Microscopy and microanalysis High resolution microscopy Electron image analysis Semiconductors

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