Intergranular lattice misorientation mapping by synchrotron x-ray micro-beams: Laue vs energy-resolved Laue vs monochromatic reciprocal space analysis
<p>Laue diffraction, energy scanning and reciprocal space mapping are three micro-beam synchrotron X-ray diffraction techniques allowing the investigation of local misorientation induced by the dislocation substructure. In this paper a comparison between the three methods is presented, based o...
| Hoofdauteurs: | , , , , |
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| Formaat: | Journal article |
| Taal: | English |
| Gepubliceerd in: |
World Scientific Publishing Company
2010
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| Onderwerpen: |