Extracting composition and alloying information of coherent Ge(Si)/Si(001) islands from [001] on-zone bright-field diffraction contrast images
Ge(Si)/Si(001) coherent islands grown at 700°C by molecular beam epitaxy were investigated using transmission electron microscopy. [001] on-zone bright-field diffraction contrast imaging and image simulation techniques were used to investigate the structure of these coherent islands. Comparison of s...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2001
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