Atom probe crystallography: Atomic-scale 3-D orientation mapping
Understanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extra...
| Հիմնական հեղինակներ: | , , , , , , |
|---|---|
| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
2012
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