Atom probe crystallography: Atomic-scale 3-D orientation mapping
Understanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extra...
| Autores principales: | , , , , , , |
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| Formato: | Journal article |
| Lenguaje: | English |
| Publicado: |
2012
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| _version_ | 1826276423597293568 |
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| author | Araullo-Peters, V Gault, B Shrestha, S Yao, L Moody, M Ringer, S Cairney, J |
| author_facet | Araullo-Peters, V Gault, B Shrestha, S Yao, L Moody, M Ringer, S Cairney, J |
| author_sort | Araullo-Peters, V |
| collection | OXFORD |
| description | Understanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extract the orientation of crystallographic directions. The disorientation across boundaries is also determined. We are now able to combine the powerful capability of atom probe for measuring the 3-D distribution of atoms with the new ability to provide accurate crystallographic information. © 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. |
| first_indexed | 2024-03-06T23:13:44Z |
| format | Journal article |
| id | oxford-uuid:6665d97c-17d3-404f-b5ef-85a52197ab2c |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T23:13:44Z |
| publishDate | 2012 |
| record_format | dspace |
| spelling | oxford-uuid:6665d97c-17d3-404f-b5ef-85a52197ab2c2022-03-26T18:31:34ZAtom probe crystallography: Atomic-scale 3-D orientation mappingJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:6665d97c-17d3-404f-b5ef-85a52197ab2cEnglishSymplectic Elements at Oxford2012Araullo-Peters, VGault, BShrestha, SYao, LMoody, MRinger, SCairney, JUnderstanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extract the orientation of crystallographic directions. The disorientation across boundaries is also determined. We are now able to combine the powerful capability of atom probe for measuring the 3-D distribution of atoms with the new ability to provide accurate crystallographic information. © 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. |
| spellingShingle | Araullo-Peters, V Gault, B Shrestha, S Yao, L Moody, M Ringer, S Cairney, J Atom probe crystallography: Atomic-scale 3-D orientation mapping |
| title | Atom probe crystallography: Atomic-scale 3-D orientation mapping |
| title_full | Atom probe crystallography: Atomic-scale 3-D orientation mapping |
| title_fullStr | Atom probe crystallography: Atomic-scale 3-D orientation mapping |
| title_full_unstemmed | Atom probe crystallography: Atomic-scale 3-D orientation mapping |
| title_short | Atom probe crystallography: Atomic-scale 3-D orientation mapping |
| title_sort | atom probe crystallography atomic scale 3 d orientation mapping |
| work_keys_str_mv | AT araullopetersv atomprobecrystallographyatomicscale3dorientationmapping AT gaultb atomprobecrystallographyatomicscale3dorientationmapping AT shresthas atomprobecrystallographyatomicscale3dorientationmapping AT yaol atomprobecrystallographyatomicscale3dorientationmapping AT moodym atomprobecrystallographyatomicscale3dorientationmapping AT ringers atomprobecrystallographyatomicscale3dorientationmapping AT cairneyj atomprobecrystallographyatomicscale3dorientationmapping |