Atom probe crystallography: Atomic-scale 3-D orientation mapping

Atom probe crystallography: Atomic-scale 3-D orientation mapping

Understanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extra...

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Үндсэн зохиолчид:	Araullo-Peters, V, Gault, B, Shrestha, S, Yao, L, Moody, M, Ringer, S, Cairney, J
Формат:	Journal article
Хэл сонгох:	English
Хэвлэсэн:	2012

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