Atom probe crystallography: Atomic-scale 3-D orientation mapping

Understanding the relationship between atomic-scale structure and properties is becoming increasingly critical as microstructures are now tailored at the nanometre length scale. Here we demonstrate 3-D mapping of grain orientations through atom probe tomography by utilizing Hough transforms to extra...

সম্পূর্ণ বিবরণ

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Araullo-Peters, V, Gault, B, Shrestha, S, Yao, L, Moody, M, Ringer, S, Cairney, J
বিন্যাস: Journal article
ভাষা:English
প্রকাশিত: 2012