Managing dose-, damage- and data-rates in multi-frame spectrum-imaging
As an instrument, the scanning transmission electron microscope is unique in being able to simultaneously explore both local structural and chemical variations in materials at the atomic scale. This is made possible as both types of data are acquired serially, originating simultaneously from sample...
| Päätekijät: | , , , , , , , , , , , , |
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| Aineistotyyppi: | Journal article |
| Julkaistu: |
Oxford University Press
2018
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