Managing dose-, damage- and data-rates in multi-frame spectrum-imaging
As an instrument, the scanning transmission electron microscope is unique in being able to simultaneously explore both local structural and chemical variations in materials at the atomic scale. This is made possible as both types of data are acquired serially, originating simultaneously from sample...
Главные авторы: | Jones, L, Varambhia, A, Beanland, R, Kepaptsoglou, D, Griffiths, I, Ishizuka, A, Azough, F, Freer, R, Ishizuka, K, Cherns, D, Ramasse, Q, Lozano-Perez, S, Nellist, P |
---|---|
Формат: | Journal article |
Опубликовано: |
Oxford University Press
2018
|
Схожие документы
-
Towards atomic-resolution electron energy loss spectroscopy in an uncorrected 30kV scanning electron microscope
по: Ramasse Quentin, и др.
Опубликовано: (2024-01-01) -
Phonon spectroscopy at atomic resolution
по: Hage, F, и др.
Опубликовано: (2019) -
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM
по: Varambhia, A, и др.
Опубликовано: (2018) -
Van der Waals epitaxy between the highly lattice mismatched Cu doped FeSe and Bi₂Te₃
по: Ghasemi, A, и др.
Опубликовано: (2017) -
Robust theoretical modelling of core ionisation edges for quantitative electron energy loss spectroscopy of B- and N-doped graphene.
по: Hardcastle, T, и др.
Опубликовано: (2017)