Understanding and optimising EBIC pn-junction characterisation from modelling insights

In this paper, the physical mechanisms involved in electron beam induced current (EBIC) imaging of semiconductor pn-junctions are reviewed to propose a model and optimise the acquisition of experimental data. Insights are drawn on the dependence of the EBIC signal with electron accelerating voltage...

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Bibliographic Details
Main Authors: Zhou, R, Yu, M, Twedde, D, Hamer, P, Chen, D, Hallam, B, Ciesla, A, Altermatt, P, Wilshaw, P, Bonilla, R
Format: Journal article
Published: AIP Publishing 2020