Electronic contribution to secondary electron compositional contrast in the scanning electron microscope

Библиографические подробности
Главные авторы: Castell, M, Perovic, D, Lafontaine, H
Формат: Journal article
Опубликовано: 1997
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author Castell, M
Perovic, D
Lafontaine, H
author_facet Castell, M
Perovic, D
Lafontaine, H
author_sort Castell, M
collection OXFORD
description
first_indexed 2024-03-06T23:25:21Z
format Journal article
id oxford-uuid:6a2f45d2-3c2b-439f-8c38-c47dbda2c7f5
institution University of Oxford
last_indexed 2024-03-06T23:25:21Z
publishDate 1997
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spelling oxford-uuid:6a2f45d2-3c2b-439f-8c38-c47dbda2c7f52022-03-26T18:55:43ZElectronic contribution to secondary electron compositional contrast in the scanning electron microscopeJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:6a2f45d2-3c2b-439f-8c38-c47dbda2c7f5Symplectic Elements at Oxford1997Castell, MPerovic, DLafontaine, H
spellingShingle Castell, M
Perovic, D
Lafontaine, H
Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
title Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
title_full Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
title_fullStr Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
title_full_unstemmed Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
title_short Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
title_sort electronic contribution to secondary electron compositional contrast in the scanning electron microscope
work_keys_str_mv AT castellm electroniccontributiontosecondaryelectroncompositionalcontrastinthescanningelectronmicroscope
AT perovicd electroniccontributiontosecondaryelectroncompositionalcontrastinthescanningelectronmicroscope
AT lafontaineh electroniccontributiontosecondaryelectroncompositionalcontrastinthescanningelectronmicroscope