Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.%SiC nanocomposites
TEM and 3D crack analysis by focused ion beam (FIB) cross sectioning have been used to quantify the subsurface damage beneath scratches made by a 120° cone indenter loaded to 1 N in monolithic polycrystalline alumina and alumina/5vol.%SiC nanocomposites. In the nanocomposite, an extensive plastic de...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2003
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