$Strain mapping using electron backscatter diffraction$

Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

وصف كامل

التفاصيل البيبلوغرافية
المؤلفون الرئيسيون:	Wilkinson, A, Dingley, D, Meaden, G
التنسيق:	Journal article
اللغة:	English
منشور في:	Springer US 2009

مواد مشابهة

High resolution mapping of strains and rotations using electron backscatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
حسب: Dingley, D, وآخرون
منشور في: (2010)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
حسب: Wilkinson, A, وآخرون
منشور في: (2006)

Mapping strains at the nanoscale using electron back scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2009)

Strain tensor mapping at the nanoscale using electron back scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2006)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
حسب: Britton, T, وآخرون
منشور في: (2010)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
حسب: Kamaya, M, وآخرون
منشور في: (2005)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
حسب: Wilkinson, A
منشور في: (1997)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
حسب: Kamaya, M, وآخرون
منشور في: (2006)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
حسب: Britton, T, وآخرون
منشور في: (2011)

Rapid electron backscatter diffraction mapping: painting by numbers
حسب: Tong, V, وآخرون
منشور في: (2018)

Direct detection of electron backscatter diffraction patterns.
حسب: Wilkinson, A, وآخرون
منشور في: (2013)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
حسب: Wilkinson, A
منشور في: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
حسب: Wilkinson, A
منشور في: (2006)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
حسب: Britton, T, وآخرون
منشور في: (2013)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
حسب: Nowakowski Pawel, وآخرون
منشور في: (2024-01-01)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
حسب: Britton, T, وآخرون
منشور في: (2012)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
حسب: Koko, A, وآخرون
منشور في: (2021)

Analysis of dislocation densities using high resolution electron backscatter diffraction
حسب: Vilalta-Clemente, A, وآخرون
منشور في: (2015)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
حسب: Naresh-Kumar, G, وآخرون
منشور في: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
حسب: G. Naresh-Kumar, وآخرون
منشور في: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
حسب: K.K. Dikhanbayev, وآخرون
منشور في: (2016-10-01)

THE MEASUREMENT OF LOCAL PLASTIC-DEFORMATION IN A METAL-MATRIX COMPOSITE BY ELECTRON BACKSCATTER PATTERNS
حسب: Wilkinson, A, وآخرون
منشور في: (1993)

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
حسب: Schäfer, N, وآخرون
منشور في: (2016)

Adaptable physics-based super-resolution for electron backscatter diffraction maps
حسب: Devendra K. Jangid, وآخرون
منشور في: (2022-12-01)

High-resolution electron backscatter diffraction in III-nitride semiconductors
حسب: Vilalta-Clemente, A, وآخرون
منشور في: (2015)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
حسب: Wallis, D, وآخرون
منشور في: (2019)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
حسب: Koko, A, وآخرون
منشور في: (2022)

Electron backscatter diffraction in materials characterization
حسب: Dejan Stojakovic
منشور في: (2012-03-01)

Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
حسب: Yang, D, وآخرون
منشور في: (2022)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
حسب: Wilkinson, A, وآخرون
منشور في: (2018)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
حسب: Tong, V, وآخرون
منشور في: (2015)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
حسب: Wilkinson, A, وآخرون
منشور في: (2016)

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
حسب: Trager-Cowan, C, وآخرون
منشور في: (2002)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
حسب: Wilkinson, A, وآخرون
منشور في: (2010)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
حسب: Wallis, D, وآخرون
منشور في: (2016)