Strain mapping using electron backscatter diffraction
In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...
Hlavní autoři: | Wilkinson, A, Dingley, D, Meaden, G |
---|---|
Médium: | Journal article |
Jazyk: | English |
Vydáno: |
Springer US
2009
|
Podobné jednotky
-
High resolution mapping of strains and rotations using electron backscatter diffraction
Autor: Wilkinson, A, a další
Vydáno: (2013) -
High resolution mapping of strains and rotations using electron backscatter diffraction
Autor: Wilkinson, A, a další
Vydáno: (2006) -
Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
Autor: Dingley, D, a další
Vydáno: (2010) -
High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
Autor: Wilkinson, A, a další
Vydáno: (2006) -
Mapping strains at the nanoscale using electron back scatter diffraction
Autor: Wilkinson, A, a další
Vydáno: (2009)