$Strain mapping using electron backscatter diffraction$

Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awduron:	Wilkinson, A, Dingley, D, Meaden, G
Fformat:	Journal article
Iaith:	English
Cyhoeddwyd:	Springer US 2009

Eitemau Tebyg

High resolution mapping of strains and rotations using electron backscatter diffraction
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
gan: Dingley, D, et al.
Cyhoeddwyd: (2010)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2006)

Mapping strains at the nanoscale using electron back scatter diffraction
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2009)

Strain tensor mapping at the nanoscale using electron back scatter diffraction
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2006)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
gan: Britton, T, et al.
Cyhoeddwyd: (2010)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
gan: Kamaya, M, et al.
Cyhoeddwyd: (2005)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
gan: Wilkinson, A
Cyhoeddwyd: (1997)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
gan: Kamaya, M, et al.
Cyhoeddwyd: (2006)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
gan: Britton, T, et al.
Cyhoeddwyd: (2011)

Rapid electron backscatter diffraction mapping: painting by numbers
gan: Tong, V, et al.
Cyhoeddwyd: (2018)

Direct detection of electron backscatter diffraction patterns.
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2013)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
gan: Wilkinson, A
Cyhoeddwyd: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
gan: Wilkinson, A
Cyhoeddwyd: (2006)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
gan: Britton, T, et al.
Cyhoeddwyd: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
gan: Britton, T, et al.
Cyhoeddwyd: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
gan: Britton, T, et al.
Cyhoeddwyd: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
gan: Britton, T, et al.
Cyhoeddwyd: (2013)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
gan: Nowakowski Pawel, et al.
Cyhoeddwyd: (2024-01-01)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
gan: Britton, T, et al.
Cyhoeddwyd: (2012)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
gan: Koko, A, et al.
Cyhoeddwyd: (2021)

Analysis of dislocation densities using high resolution electron backscatter diffraction
gan: Vilalta-Clemente, A, et al.
Cyhoeddwyd: (2015)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
gan: Naresh-Kumar, G, et al.
Cyhoeddwyd: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
gan: G. Naresh-Kumar, et al.
Cyhoeddwyd: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
gan: K.K. Dikhanbayev, et al.
Cyhoeddwyd: (2016-10-01)

THE MEASUREMENT OF LOCAL PLASTIC-DEFORMATION IN A METAL-MATRIX COMPOSITE BY ELECTRON BACKSCATTER PATTERNS
gan: Wilkinson, A, et al.
Cyhoeddwyd: (1993)

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
gan: Schäfer, N, et al.
Cyhoeddwyd: (2016)

Adaptable physics-based super-resolution for electron backscatter diffraction maps
gan: Devendra K. Jangid, et al.
Cyhoeddwyd: (2022-12-01)

High-resolution electron backscatter diffraction in III-nitride semiconductors
gan: Vilalta-Clemente, A, et al.
Cyhoeddwyd: (2015)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
gan: Wallis, D, et al.
Cyhoeddwyd: (2019)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
gan: Koko, A, et al.
Cyhoeddwyd: (2022)

Electron backscatter diffraction in materials characterization
gan: Dejan Stojakovic
Cyhoeddwyd: (2012-03-01)

Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
gan: Yang, D, et al.
Cyhoeddwyd: (2022)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2018)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
gan: Tong, V, et al.
Cyhoeddwyd: (2015)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2016)

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
gan: Trager-Cowan, C, et al.
Cyhoeddwyd: (2002)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
gan: Wilkinson, A, et al.
Cyhoeddwyd: (2010)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
gan: Wallis, D, et al.
Cyhoeddwyd: (2016)