Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

詳細記述

書誌詳細
主要な著者: Wilkinson, A, Dingley, D, Meaden, G
フォーマット: Journal article
言語:English
出版事項: Springer US 2009

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