Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

Полное описание

Библиографические подробности
Главные авторы: Wilkinson, A, Dingley, D, Meaden, G
Формат: Journal article
Язык:English
Опубликовано: Springer US 2009

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