Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

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Những tác giả chính: Wilkinson, A, Dingley, D, Meaden, G
Định dạng: Journal article
Ngôn ngữ:English
Được phát hành: Springer US 2009

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