Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
The study of Residual Stress is gaining more and more attention due to its importance in design for structural integrity. At present a lot of emphasis is placed on understanding the origins of mechanical failure that lie at the nano-/micron-scale. This leads to the evident need for evaluating residu...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Elsevier
2019
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