Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells
The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, f...
मुख्य लेखकों: | Abou-Ras, D, Kavalakkatt, J, Nichterwitz, M, Schaefer, N, Harndt, S, Wilkinson, A, Tsyrulin, K, Schulz, H, Bauer, F |
---|---|
स्वरूप: | Journal article |
प्रकाशित: |
2013
|
समान संसाधन
-
Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells
द्वारा: Abou-Ras, D, और अन्य
प्रकाशित: (2013) -
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
द्वारा: Schäfer, N, और अन्य
प्रकाशित: (2016) -
Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2006) -
Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2006) -
Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2007)