In-situ observation of stacking fault evolution in vacuum-deposited C60

In-situ observation of stacking fault evolution in vacuum-deposited C60

We report an in-situ study of stacking fault evolution in C 60 thin films using grazing-incidence x-ray scattering (GIXS). A Williamson-Hall analysis of the main scattering features during growth of a 15 nm film on glass indicate lattice strain as high as 6% in the first 5 nm of the film, with a dec...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों:	Martinez Hardigree, J, Ramirez, I, Mazzotta, G, Nicklin, C, Riede, M
स्वरूप:	Journal article
प्रकाशित:	AIP Publishing 2017

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