In-situ observation of stacking fault evolution in vacuum-deposited C60
We report an in-situ study of stacking fault evolution in C 60 thin films using grazing-incidence x-ray scattering (GIXS). A Williamson-Hall analysis of the main scattering features during growth of a 15 nm film on glass indicate lattice strain as high as 6% in the first 5 nm of the film, with a dec...
| Автори: | , , , , |
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| Формат: | Journal article |
| Опубліковано: |
AIP Publishing
2017
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