Electron ptychographic microscopy for three-dimensional imaging
Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an altern...
| Main Authors: | , , , , , , |
|---|---|
| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
Springer Nature
2017
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