Electron ptychographic microscopy for three-dimensional imaging
Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an altern...
| Main Authors: | , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Springer Nature
2017
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| _version_ | 1797074805293318144 |
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| author | Gao, S Wang, P Zhang, F Martinez, G Nellist, P Pan, X Kirkland, A |
| author_facet | Gao, S Wang, P Zhang, F Martinez, G Nellist, P Pan, X Kirkland, A |
| author_sort | Gao, S |
| collection | OXFORD |
| description | Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24-30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination with electrons. |
| first_indexed | 2024-03-06T23:41:31Z |
| format | Journal article |
| id | oxford-uuid:6f7c0c24-84e8-493c-bf79-8d3ba21fc1e1 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T23:41:31Z |
| publishDate | 2017 |
| publisher | Springer Nature |
| record_format | dspace |
| spelling | oxford-uuid:6f7c0c24-84e8-493c-bf79-8d3ba21fc1e12022-03-26T19:30:57ZElectron ptychographic microscopy for three-dimensional imagingJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:6f7c0c24-84e8-493c-bf79-8d3ba21fc1e1EnglishSymplectic Elements at OxfordSpringer Nature2017Gao, SWang, PZhang, FMartinez, GNellist, PPan, XKirkland, AKnowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24-30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination with electrons. |
| spellingShingle | Gao, S Wang, P Zhang, F Martinez, G Nellist, P Pan, X Kirkland, A Electron ptychographic microscopy for three-dimensional imaging |
| title | Electron ptychographic microscopy for three-dimensional imaging |
| title_full | Electron ptychographic microscopy for three-dimensional imaging |
| title_fullStr | Electron ptychographic microscopy for three-dimensional imaging |
| title_full_unstemmed | Electron ptychographic microscopy for three-dimensional imaging |
| title_short | Electron ptychographic microscopy for three-dimensional imaging |
| title_sort | electron ptychographic microscopy for three dimensional imaging |
| work_keys_str_mv | AT gaos electronptychographicmicroscopyforthreedimensionalimaging AT wangp electronptychographicmicroscopyforthreedimensionalimaging AT zhangf electronptychographicmicroscopyforthreedimensionalimaging AT martinezg electronptychographicmicroscopyforthreedimensionalimaging AT nellistp electronptychographicmicroscopyforthreedimensionalimaging AT panx electronptychographicmicroscopyforthreedimensionalimaging AT kirklanda electronptychographicmicroscopyforthreedimensionalimaging |