Atom probe tomography characterisation of a laser diode structure grown by molecular beam epitaxy

समान संसाधन

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  द्वारा: Bennett, SE, और अन्य
  प्रकाशित: (2011)
• Characterisation of compound semiconductors grown by molecular beam epitaxy
  द्वारा: Zhang, Peng Hua
  प्रकाशित: (2009)
• The structural characterisation of molecular beam epitaxy-grown exchange-biased bilayers
  द्वारा: Choi, Y, और अन्य
  प्रकाशित: (2002)
• Atom-probe tomography characterization of the oxidation of stainless steel
  द्वारा: Lozano-Perez, S, और अन्य
  प्रकाशित: (2010)
• Atom-probe tomography characterization of the oxidation of stainless steel
  द्वारा: Lozano-Perez, S, और अन्य
  प्रकाशित: (2010)