Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction

Improvements in instrumentation and image handling techniques mean the indirect reconstruction is now realising the promise it has long offered. This approach recovers the phase and modulus of the specimen exit plane wavefunction using datasets comprising either through focal or tiltazimuth series o...

詳細記述

書誌詳細
主要な著者: Kirkland, A, Meyer, R
フォーマット: Conference item
出版事項: 2004