APA (7th ed.) Citation

Kirkland, A., & Meyer, R. (2004). Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction.

Chicago Style (17th ed.) Citation

Kirkland, A., and R. Meyer. Indirect Transmission Electron Microscopy; Aberration Measurement and Compensation and Exit Wave Reconstruction. 2004.

MLA (9th ed.) Citation

Kirkland, A., and R. Meyer. Indirect Transmission Electron Microscopy; Aberration Measurement and Compensation and Exit Wave Reconstruction. 2004.

Warning: These citations may not always be 100% accurate.