Kirkland, A., & Meyer, R. (2004). Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction.
Citace podle Chicago (17th ed.)Kirkland, A., a R. Meyer. Indirect Transmission Electron Microscopy; Aberration Measurement and Compensation and Exit Wave Reconstruction. 2004.
Citace podle MLA (9th ed.)Kirkland, A., a R. Meyer. Indirect Transmission Electron Microscopy; Aberration Measurement and Compensation and Exit Wave Reconstruction. 2004.
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