Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
Improvements in instrumentation and image handling techniques mean the indirect reconstruction is now realising the promise it has long offered. This approach recovers the phase and modulus of the specimen exit plane wavefunction using datasets comprising either through focal or tiltazimuth series o...
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| Format: | Conference item |
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2004
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| _version_ | 1797075161591054336 |
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| author | Kirkland, A Meyer, R |
| author_facet | Kirkland, A Meyer, R |
| author_sort | Kirkland, A |
| collection | OXFORD |
| description | Improvements in instrumentation and image handling techniques mean the indirect reconstruction is now realising the promise it has long offered. This approach recovers the phase and modulus of the specimen exit plane wavefunction using datasets comprising either through focal or tiltazimuth series of images. In order to achieve this it is necessary to measure the objective lens aberrations to high accuracy. This paper will review progress in implementing this approach and will present recent reconstructions from a range of materials. |
| first_indexed | 2024-03-06T23:46:26Z |
| format | Conference item |
| id | oxford-uuid:71110518-1a9f-410b-a71a-abdbd18ae6f3 |
| institution | University of Oxford |
| last_indexed | 2024-03-06T23:46:26Z |
| publishDate | 2004 |
| record_format | dspace |
| spelling | oxford-uuid:71110518-1a9f-410b-a71a-abdbd18ae6f32022-03-26T19:41:15ZIndirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstructionConference itemhttp://purl.org/coar/resource_type/c_5794uuid:71110518-1a9f-410b-a71a-abdbd18ae6f3Symplectic Elements at Oxford2004Kirkland, AMeyer, RImprovements in instrumentation and image handling techniques mean the indirect reconstruction is now realising the promise it has long offered. This approach recovers the phase and modulus of the specimen exit plane wavefunction using datasets comprising either through focal or tiltazimuth series of images. In order to achieve this it is necessary to measure the objective lens aberrations to high accuracy. This paper will review progress in implementing this approach and will present recent reconstructions from a range of materials. |
| spellingShingle | Kirkland, A Meyer, R Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction |
| title | Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction |
| title_full | Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction |
| title_fullStr | Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction |
| title_full_unstemmed | Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction |
| title_short | Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction |
| title_sort | indirect transmission electron microscopy aberration measurement and compensation and exit wave reconstruction |
| work_keys_str_mv | AT kirklanda indirecttransmissionelectronmicroscopyaberrationmeasurementandcompensationandexitwavereconstruction AT meyerr indirecttransmissionelectronmicroscopyaberrationmeasurementandcompensationandexitwavereconstruction |