Microstructural evolution of mechanically deformed polycrystalline silicon for kerfless photovoltaics

Silicon wafers for photovoltaics could be produced without kerf loss by rolling, provided sufficient control of defects such as dislocations can be achieved. A study using mainly high resolution electron backscatter diffraction (HR‐EBSD) of the microstructural evolution of Siemens polycrystalline si...

詳細記述

書誌詳細
主要な著者: Wu, M, Murphy, J, Jiang, J, Wilshaw, P, Wilkinson, A
フォーマット: Journal article
出版事項: Wiley 2018