Microstructural evolution of mechanically deformed polycrystalline silicon for kerfless photovoltaics
Silicon wafers for photovoltaics could be produced without kerf loss by rolling, provided sufficient control of defects such as dislocations can be achieved. A study using mainly high resolution electron backscatter diffraction (HR‐EBSD) of the microstructural evolution of Siemens polycrystalline si...
| Main Authors: | , , , , |
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| 格式: | Journal article |
| 出版: |
Wiley
2018
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