TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS

Míreanna comhchosúla

• PERFORMANCE AND APPLICATIONS OF AN IMAGING ATOM-PROBE
  de réir: Miller, M, et al.
  Foilsithe / Cruthaithe: (1979)
• APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
  de réir: Miller, M, et al.
  Foilsithe / Cruthaithe: (1994)
• FIM AND ATOM-PROBE STUDIES OF DEFECTS IN DOPED TUNGSTEN LAMP WIRES
  de réir: Beaven, P, et al.
  Foilsithe / Cruthaithe: (1979)
• PROGRESS WITH FIM AND ATOM-PROBE INVESTIGATIONS OF NICKEL-BASED SUPER-ALLOYS
  de réir: Delargy, K, et al.
  Foilsithe / Cruthaithe: (1979)
• Microanalysis at the atomic level
  de réir: Pennycook, S, et al.
  Foilsithe / Cruthaithe: (1995)