GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS
Glavni autori: | Decoteau, M, Wilshaw, P, Falster, R |
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Format: | Conference item |
Izdano: |
1991
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Slični predmeti
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GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS
od: Decoteau, M, i dr.
Izdano: (1991) -
GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
od: Decoteau, M, i dr.
Izdano: (1992) -
PRECIPITATION OF IRON IN SILICON - GETTERING TO EXTENDED SURFACE DEFECT SITES
od: Decoteau, M, i dr.
Izdano: (1991) -
GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
od: Decoteau, M, i dr.
Izdano: (1990) -
GETTERING IN SILICON
od: Falster, R
Izdano: (1989)