GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS

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Xehetasun bibliografikoak
Egile Nagusiak:	Decoteau, M, Wilshaw, P, Falster, R
Formatua:	Conference item
Argitaratua:	1991

Antzeko izenburuak

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS
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GETTERING IN SILICON
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Saw damage gettering for industrially relevant mc‐Si feedstock
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Simulation of iron impurity gettering in crystalline silicon solar cells
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Electron beam induced current investigations of transition metal impurities at extended defects in silicon
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DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon
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Effects of Phosphorus Diffusion on Gettering of Metal Impurities in UMG Silicon Wafers
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Cathodoluminescence assessment of annealed silicon and a novel technique for estimating minority carrier lifetime in silicon
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Evaluation of Hydrogen Gettering Rates Correlated to Surface Composition and Texture of Nickel-Plated Zircaloy Getters of Different Heat Treatment Procedures
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Effective lifetimes exceeding 300 μs in gettered p-type epitaxial kerfless silicon for photovoltaics
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The segregation behaviour of oxygen at dislocations in silicon
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Locking of dislocations by oxygen in Cz-silicon
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Finite- vs. infinite-source emitters in silicon photovoltaics: Effect on transition metal gettering
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High resolution deep level transient spectroscopy applied to extended defects in silicon
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Recombination at oxide precipitates in silicon
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Generation of dislocation glide loops in Czochralski silicon
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Dislocation locking by nitrogen impurities in FZ-silicon
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On the mechanism of recombination at oxide precipitates in silicon
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