Explaining image classifiers using statistical fault localization

Explaining image classifiers using statistical fault localization

The black-box nature of deep neural networks (DNNs) makes it impossible to understand why a particular output is produced, creating demand for “Explainable AI”. In this paper, we show that statistical fault localization (SFL) techniques from software engineering deliver high quality explanations of...

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Autors principals:	Sun, Y, Chockler, H, Huang, X, Kroening, D
Format:	Conference item
Idioma:	English
Publicat:	Springer 2020

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