Explaining image classifiers using statistical fault localization

Explaining image classifiers using statistical fault localization

The black-box nature of deep neural networks (DNNs) makes it impossible to understand why a particular output is produced, creating demand for “Explainable AI”. In this paper, we show that statistical fault localization (SFL) techniques from software engineering deliver high quality explanations of...

Полное описание

Библиографические подробности
Главные авторы:	Sun, Y, Chockler, H, Huang, X, Kroening, D
Формат:	Conference item
Язык:	English
Опубликовано:	Springer 2020

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